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Ders Notları

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Öğretim Üyesi (Üyeleri): Prof. Dr. Ömer Andaç *

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Yıl: 2025, Dönem: Güz
KİM445, Yüzey Analizi Teknikleri (mufredatId:4085, dersId: 66098, programId: 5435)
Ders Kitabı / Malzemesi / Önerilen Kaynaklar

https://www.lucideon.com/testing-characterization/analytical-techniques-surface-analysis Surface scienced e-books

Dersin İçeriği

yüzey analiz teknikleri ile ilgili bilgilendirmek

Dersin Amacı

yüzey analiz teknikleri ile ilgili bilgilendirmek

Haftalık Ders İçeriği

Hafta Teorik Uygulama Laboratuar Ders Notları
1 1 Yüzey kimyası 2 Yüzey özellikleri 3 SEM/EDX (Scanning Electron Microscopy / Energy Dispersive Analysis) 4 SEM/EDX (Scanning Electron Microscopy / Energy Dispersive Analysis) 5 AFM (Atomic Force Microscopy) 6 FTIR (Fourier Transform Infrared Analysis) 7 Raman Spectroscopy 8 XRD (X-Ray Diffraction) 9 XPS (X-ray Photoelectron Spectroscopy) 10 Ara sınav 11 Dynamic SIMS (Secondary Ion Mass Spectrometry) 12 ToF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) 13 Profilometry 14 WLI (White Light Interferometry)
2 1 Yüzey kimyası 2 Yüzey özellikleri 3 SEM/EDX (Scanning Electron Microscopy / Energy Dispersive Analysis) 4 SEM/EDX (Scanning Electron Microscopy / Energy Dispersive Analysis) 5 AFM (Atomic Force Microscopy) 6 FTIR (Fourier Transform Infrared Analysis) 7 Raman Spectroscopy 8 XRD (X-Ray Diffraction) 9 XPS (X-ray Photoelectron Spectroscopy) 10 Ara sınav 11 Dynamic SIMS (Secondary Ion Mass Spectrometry) 12 ToF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) 13 Profilometry 14 WLI (White Light Interferometry)
3 1 Yüzey kimyası 2 Yüzey özellikleri 3 SEM/EDX (Scanning Electron Microscopy / Energy Dispersive Analysis) 4 SEM/EDX (Scanning Electron Microscopy / Energy Dispersive Analysis) 5 AFM (Atomic Force Microscopy) 6 FTIR (Fourier Transform Infrared Analysis) 7 Raman Spectroscopy 8 XRD (X-Ray Diffraction) 9 XPS (X-ray Photoelectron Spectroscopy) 10 Ara sınav 11 Dynamic SIMS (Secondary Ion Mass Spectrometry) 12 ToF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) 13 Profilometry 14 WLI (White Light Interferometry)
4 1 Yüzey kimyası 2 Yüzey özellikleri 3 SEM/EDX (Scanning Electron Microscopy / Energy Dispersive Analysis) 4 SEM/EDX (Scanning Electron Microscopy / Energy Dispersive Analysis) 5 AFM (Atomic Force Microscopy) 6 FTIR (Fourier Transform Infrared Analysis) 7 Raman Spectroscopy 8 XRD (X-Ray Diffraction) 9 XPS (X-ray Photoelectron Spectroscopy) 10 Ara sınav 11 Dynamic SIMS (Secondary Ion Mass Spectrometry) 12 ToF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) 13 Profilometry 14 WLI (White Light Interferometry)
5 1 Yüzey kimyası 2 Yüzey özellikleri 3 SEM/EDX (Scanning Electron Microscopy / Energy Dispersive Analysis) 4 SEM/EDX (Scanning Electron Microscopy / Energy Dispersive Analysis) 5 AFM (Atomic Force Microscopy) 6 FTIR (Fourier Transform Infrared Analysis) 7 Raman Spectroscopy 8 XRD (X-Ray Diffraction) 9 XPS (X-ray Photoelectron Spectroscopy) 10 Ara sınav 11 Dynamic SIMS (Secondary Ion Mass Spectrometry) 12 ToF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) 13 Profilometry 14 WLI (White Light Interferometry)
6 1 Yüzey kimyası 2 Yüzey özellikleri 3 SEM/EDX (Scanning Electron Microscopy / Energy Dispersive Analysis) 4 SEM/EDX (Scanning Electron Microscopy / Energy Dispersive Analysis) 5 AFM (Atomic Force Microscopy) 6 FTIR (Fourier Transform Infrared Analysis) 7 Raman Spectroscopy 8 XRD (X-Ray Diffraction) 9 XPS (X-ray Photoelectron Spectroscopy) 10 Ara sınav 11 Dynamic SIMS (Secondary Ion Mass Spectrometry) 12 ToF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) 13 Profilometry 14 WLI (White Light Interferometry)
7 1 Yüzey kimyası 2 Yüzey özellikleri 3 SEM/EDX (Scanning Electron Microscopy / Energy Dispersive Analysis) 4 SEM/EDX (Scanning Electron Microscopy / Energy Dispersive Analysis) 5 AFM (Atomic Force Microscopy) 6 FTIR (Fourier Transform Infrared Analysis) 7 Raman Spectroscopy 8 XRD (X-Ray Diffraction) 9 XPS (X-ray Photoelectron Spectroscopy) 10 Ara sınav 11 Dynamic SIMS (Secondary Ion Mass Spectrometry) 12 ToF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) 13 Profilometry 14 WLI (White Light Interferometry)
8 1 Yüzey kimyası 2 Yüzey özellikleri 3 SEM/EDX (Scanning Electron Microscopy / Energy Dispersive Analysis) 4 SEM/EDX (Scanning Electron Microscopy / Energy Dispersive Analysis) 5 AFM (Atomic Force Microscopy) 6 FTIR (Fourier Transform Infrared Analysis) 7 Raman Spectroscopy 8 XRD (X-Ray Diffraction) 9 XPS (X-ray Photoelectron Spectroscopy) 10 Ara sınav 11 Dynamic SIMS (Secondary Ion Mass Spectrometry) 12 ToF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) 13 Profilometry 14 WLI (White Light Interferometry)
9 1 Yüzey kimyası 2 Yüzey özellikleri 3 SEM/EDX (Scanning Electron Microscopy / Energy Dispersive Analysis) 4 SEM/EDX (Scanning Electron Microscopy / Energy Dispersive Analysis) 5 AFM (Atomic Force Microscopy) 6 FTIR (Fourier Transform Infrared Analysis) 7 Raman Spectroscopy 8 XRD (X-Ray Diffraction) 9 XPS (X-ray Photoelectron Spectroscopy) 10 Ara sınav 11 Dynamic SIMS (Secondary Ion Mass Spectrometry) 12 ToF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) 13 Profilometry 14 WLI (White Light Interferometry)
10 1 Yüzey kimyası 2 Yüzey özellikleri 3 SEM/EDX (Scanning Electron Microscopy / Energy Dispersive Analysis) 4 SEM/EDX (Scanning Electron Microscopy / Energy Dispersive Analysis) 5 AFM (Atomic Force Microscopy) 6 FTIR (Fourier Transform Infrared Analysis) 7 Raman Spectroscopy 8 XRD (X-Ray Diffraction) 9 XPS (X-ray Photoelectron Spectroscopy) 10 Ara sınav 11 Dynamic SIMS (Secondary Ion Mass Spectrometry) 12 ToF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) 13 Profilometry 14 WLI (White Light Interferometry)
11 1 Yüzey kimyası 2 Yüzey özellikleri 3 SEM/EDX (Scanning Electron Microscopy / Energy Dispersive Analysis) 4 SEM/EDX (Scanning Electron Microscopy / Energy Dispersive Analysis) 5 AFM (Atomic Force Microscopy) 6 FTIR (Fourier Transform Infrared Analysis) 7 Raman Spectroscopy 8 XRD (X-Ray Diffraction) 9 XPS (X-ray Photoelectron Spectroscopy) 10 Ara sınav 11 Dynamic SIMS (Secondary Ion Mass Spectrometry) 12 ToF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) 13 Profilometry 14 WLI (White Light Interferometry)
12 1 Yüzey kimyası 2 Yüzey özellikleri 3 SEM/EDX (Scanning Electron Microscopy / Energy Dispersive Analysis) 4 SEM/EDX (Scanning Electron Microscopy / Energy Dispersive Analysis) 5 AFM (Atomic Force Microscopy) 6 FTIR (Fourier Transform Infrared Analysis) 7 Raman Spectroscopy 8 XRD (X-Ray Diffraction) 9 XPS (X-ray Photoelectron Spectroscopy) 10 Ara sınav 11 Dynamic SIMS (Secondary Ion Mass Spectrometry) 12 ToF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) 13 Profilometry 14 WLI (White Light Interferometry)
13 1 Yüzey kimyası 2 Yüzey özellikleri 3 SEM/EDX (Scanning Electron Microscopy / Energy Dispersive Analysis) 4 SEM/EDX (Scanning Electron Microscopy / Energy Dispersive Analysis) 5 AFM (Atomic Force Microscopy) 6 FTIR (Fourier Transform Infrared Analysis) 7 Raman Spectroscopy 8 XRD (X-Ray Diffraction) 9 XPS (X-ray Photoelectron Spectroscopy) 10 Ara sınav 11 Dynamic SIMS (Secondary Ion Mass Spectrometry) 12 ToF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) 13 Profilometry 14 WLI (White Light Interferometry)
14 1 Yüzey kimyası 2 Yüzey özellikleri 3 SEM/EDX (Scanning Electron Microscopy / Energy Dispersive Analysis) 4 SEM/EDX (Scanning Electron Microscopy / Energy Dispersive Analysis) 5 AFM (Atomic Force Microscopy) 6 FTIR (Fourier Transform Infrared Analysis) 7 Raman Spectroscopy 8 XRD (X-Ray Diffraction) 9 XPS (X-ray Photoelectron Spectroscopy) 10 Ara sınav 11 Dynamic SIMS (Secondary Ion Mass Spectrometry) 12 ToF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) 13 Profilometry 14 WLI (White Light Interferometry)