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Öğretim Üyesi (Üyeleri): Dr. Öğr. Üyesi İbrahim İnanç *

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Yıl: 2025, Dönem: Güz
ENNT711, Scannıng Probe Mıcroscopy (mufredatId:6466, dersId: 27527, programId: 5236)
Ders Kitabı / Malzemesi / Önerilen Kaynaklar

1. Greg Haugstad, “Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications”, Wiley, 2012.

Dersin İçeriği

The course is designed for students from a wide variety of educational backgrounds, from Physics, Chemistry and Biology, who would like to learn about the technical details of how SPMs work, and the possibilities and pitfalls in interpreting the images that SPM's produce. We will look in detail at some of the many different modes of SPM usage, with particular emphasis on Atomic Force Microscopy (AFM) and its many variations.

Dersin Amacı

To provide the theoretical background and physical intuitation necessary to understand how SPM's operate and how to interpret the images they produce. To provide an practical, hands-on introduction to the operation of SPMs in a laboratory setting.

Haftalık Ders İçeriği

Hafta Teorik Uygulama Laboratuar Ders Notları
1 Introduction to SPM
2 AFM Components, Imaging Software
3 Scanners, Sensors, Feedback and Control
4 Cantilevers and Tips, Force Measurements
5 Fluctuations, Noise and Fundamental Limits
6 Surface Forces, Adhesion and Friction
7 AFM Modes
8 AFM Modes
9 Midterm Exam
10 Scanning Tunneling Microscopy
11 Optical SPM techniques: principles and practical applications
12 Atomic manipulation and nanolithography
13 Applications of SPM in: condensed matter, chemistry, and nanotechnology.
14 Examples of more advanced SPM techniques and combined methods